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High-resolution FESEM with 1.0 nm resolution, magnification up to 650,000x, EDX elemental analysis, and large sample capacity.
JSM-6700F is a field emission scanning electron microscope (FESEM) developed by JEOL Ltd., designed for high-resolution imaging of microstructures. Incorporating a cold cathode field emission gun and advanced digital technologies, this instrument delivers exceptional image quality, making it indispensable for detailed material analysis.
Key features include:
The JSM-6700F is widely utilized in various scientific domains, including materials science, nanotechnology, biotechnology, and semiconductor research. Its high-resolution imaging and analytical capabilities make it particularly valuable in biotechnology for applications such as bioprocessing, gene editing, and molecular diagnostics. Researchers employ this instrument to examine cellular structures, biomaterials, and nanoparticles, contributing to advancements in synthetic biology and biomanufacturing.
Commonly found in university laboratories, biomedical research centres, and clinical environments, the JSM-6700F supports a wide range of investigative studies. First introduced in the early 2000s, it remains relevant in contemporary research settings due to its robust performance and adaptability.
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With a service contract, ten to fifteen years is normal for most benchtop instruments. Detectors and pumps are the parts that wear first.
Often, yes. Verified suppliers frequently work with service partners converting the instrument. If applicable, we can list servicing options alongside the offer.
Ask a scientist through the request button. Parts are often available even when the instrument itself is discontinued.
Two to six weeks, depending on refurbishment scope and whether calibration is included.
We ship to 38 countries. Crating and customs handling are quoted with the instrument.
Tell us what you need and a scientist finds it for you, usually within the hour.
Last updated 3 November 2026
