JEOL JEM-2100F

Name: JEOL JEM-2100F
Brand: JEOL
SKU: 68768
Availability: PreOrder

UsedJEOLElectron microscopesNetherlands

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Point-to-point resolution: 0.19 nm
Lattice resolution: 0.1 nm
Accelerating voltage: 80–200 kV
Electron source: ZrO/W(100) Schottky emitter
Brightness: ≥4×10⁸ A/cm²/sr
Availability: Procurable
Lead time: Confirmed with your quote

All 24 specifications

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Specifications 24

Brands: JEOL
New/Used: Used
Point-to-point resolution: 0.19 nm
Lattice resolution: 0.1 nm
Accelerating voltage: 80–200 kV
Electron source: ZrO/W(100) Schottky emitter
Brightness: ≥4×10⁸ A/cm²/sr
Probe current: 0.5 nA for 1 nm probe
Specimen tilt range (X/Y): ±25/±25°
Specimen tilt range (X): ±25°
Specimen shift (X/Y): 2 mm
Specimen shift (Z): ±0.1 mm

Spot size (TEM mode): 2 to 5 nm
Spot size (EDS mode): 0.5 to 2.4 nm
Convergence angle (2α): 1.5 to 20 mrad
Acceptance angle: ±10°
Magnification (MAG mode): ×2,000 to 1,500,000
Magnification (LOW MAG mode): ×50 to 6,000
Magnification (SA MAG mode): ×8,000 to 800,000
Camera length (SA diffraction): 80 to 2,000 mm
Camera length (HD diffraction): 4 to 80 m
Camera length (HR diffraction): 333 mm
Availability: Procurable
Lead time: Confirmed with your quote

Product description

200 kV TEM with 0.19 nm resolution, EDS and EELS analysis, HAADF/BF detectors, and advanced in-situ specimen holders.

The JEOL JEM-2100F is a high-performance 200 kV field emission transmission electron microscope (TEM) designed for advanced imaging and analytical applications across various scientific disciplines. This instrument delivers exceptional spatial resolution and analytical capabilities, making it indispensable for researchers requiring detailed structural and compositional analyses at the atomic level.

Key features include:

High-resolution imaging: Achieves a point-to-point resolution of 0.19 nm, facilitating detailed lattice imaging.
Versatile analytical tools: Equipped with Energy Dispersive X-ray Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS) for comprehensive chemical analysis.
Advanced detectors: Features High-Angle Annular Dark Field (HAADF) and Bright Field (BF) detectors for diverse imaging modes.
Flexible operating voltages: Operates at variable voltages between 80–200 kV, accommodating a wide range of sample types.
Specialised specimen holders: Includes options for single and double tilt, heating up to 1000°C, and cryogenic cooling down to 5K, enabling in-situ experiments.

This TEM is widely utilised in fields such as materials science, nanotechnology, biology, and medicine. It is commonly found in university laboratories, biomedical research centres, and industrial R&D facilities. Since its introduction, the JEOL JEM-2100F has remained a cornerstone in electron microscopy, continuing to support cutting-edge research and innovation.

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Frequently asked questions

How long does laboratory equipment typically last?

With a service contract, ten to fifteen years is normal for most benchtop instruments. Detectors and pumps are the parts that wear first.

Can I get service for older equipment?

Often, yes. Verified suppliers frequently work with service partners converting the instrument. If applicable, we can list servicing options alongside the offer.

Where can I buy parts?

Ask a scientist through the request button. Parts are often available even when the instrument itself is discontinued.

What is the typical lead time for refurbished equipment?

Two to six weeks, depending on refurbishment scope and whether calibration is included.

Does laboratory equipment ship internationally?

We ship to 38 countries. Crating and customs handling are quoted with the instrument.