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High-resolution TEM with LaB₆ gun (80–200 kV), 0.19 nm resolution, SAED/CBED, and CCD digital imaging.
JEOL 2010 is a high-resolution transmission electron microscope (TEM) designed for detailed structural analysis of materials at the atomic scale. Introduced in the late 1990s, this instrument remains a valuable tool in various scientific disciplines.
Key features include:
This TEM is widely utilized in fields such as materials science, nanotechnology, geophysics, geochemistry, and biological research. Its applications range from analyzing metals, ceramics, and minerals to studying nanostructured materials and biological tissues.
Commonly found in university laboratories, research institutions, and biomedical research centres, the JEOL 2010 continues to support advanced research and development efforts. Its enduring relevance underscores its robust design and adaptability to various scientific inquiries.
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With a service contract, ten to fifteen years is normal for most benchtop instruments. Detectors and pumps are the parts that wear first.
Yes. Every verified supplier states which service partners cover the instrument, and we list that alongside the offer.
Ask a scientist through the request button. Parts are often available even when the instrument itself is discontinued.
Two to six weeks, depending on refurbishment scope and whether calibration is included.
We ship to 38 countries. Crating and customs handling are quoted with the instrument.
Tell us what you need and a scientist finds it for you, usually within the hour.
Last updated 19 October 2026