JEOL JEM-ARM200F

The JEOL JEM-2100 is a versatile 200 kV Transmission Electron Microscope (TEM) designed for high-resolution imaging and analysis across various scientific disciplines. Equipped with a LaB₆ electron gun, this instrument delivers exceptional performance with a cost-effective design, making it suitable for both materials science and biological research.

Key features include:

• High-resolution imaging: Achieves a point resolution of 0.194 nm and a lattice resolution of 0.14 nm, enabling atomic-level observation.
• Versatile accelerating voltages: Operates at multiple voltages (80, 100, 120, 160, and 200 kV) to accommodate diverse sample requirements.
• Scanning Transmission Electron Microscopy (STEM): Optional STEM capabilities allow for nanometer-scale scanning imaging.
• Energy-Dispersive X-ray Spectroscopy (EDS): Integrated EDS system with a solid angle up to 0.28 sr facilitates sensitive elemental analysis at the nanoscale.
• Stable specimen stage: Ensures long-term observation and analysis with minimal drift.

This TEM is widely utilized in biotechnology, particularly for applications such as virus identification, nanoparticle toxicity assessment, and protein imaging. Its high-resolution capabilities are essential for detailed structural analysis in molecular biology and biomedical engineering.

Commonly found in university laboratories, biomedical research centres, and clinical environments, the JEM-2100 supports a broad range of scientific investigations. First introduced in the early 2000s, it remains a relevant and reliable tool in the field of electron microscopy.