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200 kV TEM with 0.19 nm resolution, field-emission gun, STEM HAADF, EDS, EELS, and CCD imaging.
JEOL 2010F is a high-resolution transmission electron microscope (TEM) designed for detailed structural and compositional analysis at the nanoscale. Operating at 200 kV, this instrument delivers a point-to-point resolution of 0.19 nm, making it ideal for applications requiring atomic-level imaging.
Key features include:
This TEM is widely utilised in fields such as materials science, nanotechnology, and biotechnology, facilitating research in areas like biomaterials development, nanostructure characterisation, and molecular diagnostics. It is commonly found in university laboratories, biomedical research centres, and industrial R&D facilities.
Introduced in the late 1990s, the JEOL 2010F remains relevant today, with many institutions continuing to employ this robust instrument for advanced research applications.
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We're an independent team based in The Netherlands, working with research labs and procurement teams across Europe and worldwide.
With a service contract, ten to fifteen years is normal for most benchtop instruments. Detectors and pumps are the parts that wear first.
Often, yes. Verified suppliers frequently work with service partners converting the instrument. If applicable, we can list servicing options alongside the offer.
Ask a scientist through the request button. Parts are often available even when the instrument itself is discontinued.
Two to six weeks, depending on refurbishment scope and whether calibration is included.
We ship to 38 countries. Crating and customs handling are quoted with the instrument.
Tell us what you need and a scientist finds it for you, usually within the hour.
Last updated 22 October 2026
