Hitachi S-4800

The Hitachi S-4800 is a high-resolution field emission scanning electron microscope (FE-SEM) designed for detailed surface analysis across various scientific disciplines. Utilising a cold field emission electron source, this instrument delivers exceptional imaging capabilities, making it indispensable for researchers requiring precise topographical and compositional insights.

Key features include:

• Ultra-high resolution imaging: Achieves 1.0 nm resolution at 15 kV and 1.4 nm at 1 kV, facilitating the observation of fine surface details.
• Wide magnification range: Offers magnifications from 30x to 800,000x, accommodating diverse analytical needs.
• Advanced detection technology: Incorporates the "Super ExB Filter" to effectively separate secondary electron (SE) and backscattered electron (BSE) signals, enhancing image contrast and compositional analysis.
• Versatile specimen stage: Features a motorised 5-axis eucentric stage with movements of 110 mm x 110 mm, tilt from -5° to +70°, and 360° rotation, supporting large and complex samples.
• Energy-dispersive X-ray spectroscopy (EDS): Equipped with EDS systems, such as the Oxford Instruments Ultim Max 100 mm² detector, enabling real-time elemental analysis and mapping.

The S-4800 is widely employed in fields such as materials science, nanotechnology, biotechnology, and semiconductor research. Its applications range from analysing nanostructures and biological specimens to evaluating semiconductor devices and advanced materials.

Commonly utilised in university laboratories, biomedical research centres, and industrial R&D facilities, this FE-SEM supports a broad spectrum of investigative and quality control processes.

Introduced in the early 2000s, the Hitachi S-4800 remains a relevant and valuable tool in contemporary research settings, reflecting Hitachi's commitment to innovation in electron microscopy.