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FE-SEM with 1.0 nm resolution, 30x-800,000x magnification, motorized 5-axis stage, and EDS elemental analysis.
The Hitachi S-4800 is a high-resolution field emission scanning electron microscope (FE-SEM) designed for detailed imaging and analysis of material surfaces at the nanoscale. Introduced in the mid-2000s, this instrument remains a valuable tool in various scientific and industrial applications.
Key features include:
This FE-SEM is widely utilized in fields such as materials science, nanotechnology, biotechnology, and semiconductor research. Its high-resolution imaging capabilities make it indispensable for analyzing surface topography, morphology, and composition at the nanoscale.
Commonly found in university laboratories, research institutions, and industrial R&D centers, the Hitachi S-4800 continues to support cutting-edge research and development efforts.
Lab equipment markets are fragmented. Buyers spend weeks calling distributors, comparing quotes, and verifying supplier reliability. Sellers struggle to reach global research labs.
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We're an independent team based in The Netherlands, working with research labs and procurement teams across Europe and worldwide.
With a service contract, ten to fifteen years is normal for most benchtop instruments. Detectors and pumps are the parts that wear first.
Often, yes. Verified suppliers frequently work with service partners converting the instrument. If applicable, we can list servicing options alongside the offer.
Ask a scientist through the request button. Parts are often available even when the instrument itself is discontinued.
Two to six weeks, depending on refurbishment scope and whether calibration is included.
We ship to 38 countries. Crating and customs handling are quoted with the instrument.
Tell us what you need and a scientist finds it for you, usually within the hour.
Last updated 22 October 2026
