Malvern Panalytical Empyrean

The PANalytical Empyrean X-ray Diffractometer is a versatile instrument designed for comprehensive crystallographic analysis across various materials. This diffractometer enables researchers to investigate phase identification, texture, residual stress, and pair distribution functions, providing critical insights into material properties.

Key features include:

• Cu and Mo radiation sources for both low- and high-energy X-ray diffraction (XRD) applications.
• Reflection and transmission geometries with rotating sample capabilities to enhance statistical accuracy.
• Spinning capillary functionality for analysing air-sensitive materials or small sample sizes.
• Bragg–Brentano optics and focusing geometry for precise diffraction measurements.
• Residual strain measurement capabilities to assess internal stresses within materials.
• Microdiffraction with a 100 µm beam using Cu/Mo focusing mirror and monocapillary optics.
• 5-axis Eulerian cradle for comprehensive texture mapping.
• Small- and wide-angle X-ray scattering (SAXS/WAXS) for analysing nanostructures.
• Grazing incidence XRD for surface-sensitive analyses.
• Pair distribution function analysis to study local atomic arrangements.
• Galipix 3D area detector for rapid and accurate data collection.
• In situ stages capable of operating from −190°C up to 1100°C with a 3-axis cradle for temperature-dependent studies.
• Multiple X-ray tubes (Cr, Cu, Mo) available to accommodate a variety of measurement requirements.
• High-resolution residual stress analysis including parallel beam optics and microbeam dual mask sets.

This diffractometer is widely utilised in fields such as materials science, pharmaceutical research, nanotechnology, and metallurgy. It is commonly found in university laboratories, biomedical research centres, and industrial R&D facilities. The Empyrean X-ray Diffractometer remains a relevant and powerful tool in contemporary research, offering advanced capabilities for material characterisation.