Hitachi S-2600N Scanning Electron Microscope with Oxford X-Max 50 mm² Inca EDS Detector

The Hitachi S-2600N Scanning Electron Microscope (SEM) is a high-performance benchtop SEM designed for detailed surface imaging and microstructural analysis in materials science, biomedical engineering, and biotechnology research. Paired with the Oxford X-Max 50 mm² Inca Energy-Dispersive X-ray Spectroscopy (EDS) detector, this setup offers precise elemental composition characterization essential for molecular diagnostics and bioprocessing workflows.

Key technical features include:

• High-resolution electron imaging for topographical and morphological examination
• 50 mm² large-area silicon drift detector enhancing X-ray count rates and spectral resolution
• Real-time elemental mapping suited for synthetic biology research and biomanufacturing quality control
• Compatibility with advanced sample stages for complex biological and materials samples
• Critical in biopharmaceutical production pipelines requiring accurate elemental distribution analysis

Widely adopted in biotechnology and clinical diagnostics settings, the combination facilitates comprehensive analysis workflows from live-cell imaging preparations to gene editing material characterization. This integrated SEM-EDS system is essential for researchers demanding robust surface imaging coupled with detailed elemental insights.