Amphenol PCD TJSE20830 Size 20 In-Line Junction Electronic Splice Module

The Amphenol PCD TJSE20830 Series 1 in-line junction electronic splice module is engineered for high-reliability connectivity in demanding environments, making it essential for aerospace, defense, and biotechnology instrumentation. This size 20 electronic splice module features:

• 2 socket contacts per module, contact size 20, complying with MIL-SPEC M81714/24 and qualified under QPL M81714/24 standards
• Contact Part Number M39029/1-101, with copper alloy contacts hard gold plated per MIL-G-45204 for excellent conductivity and corrosion resistance
• Operating temperature range spans from -65°C to 200°C, suitable for extreme thermal conditions common in bioprocessing equipment and biomanufacturing pipelines
• High insulation resistance of 5000 megohms at 25°C and dielectric withstanding voltage of 1500 VRMS at sea level and 200 VRMS at 100,000 ft elevation, ensuring signal integrity in molecular diagnostics and synthetic biology instrumentation
• Durable body constructed from polyetherimide per ASTM-D5205 and grommet made with silicone blend elastomer per A-A-59588, providing robust mechanical and environmental protection
• Contact retainers are stainless steel ensuring vibration and shock resistance, certified to MIL-T-81714 paragraph 3.5.5 and 3.5.8, critical for reliable connectivity in biomedical engineering research equipment
• Integrated 0.5 AMP 125V fuse for circuit protection enhancing safety during high-precision fluorescence analysis setups and live-cell imaging systems
• The module's blue color coding aids in quick identification within complex wiring assemblies, a practical feature in large-scale bioprocessing facilities

Designed specifically for electronic interconnection in rugged environments, this splice module is widely adopted in critical applications across molecular biology, clinical diagnostics, and synthetic biology research domains where dependable electrical connections underpin experimental accuracy and biomanufacturing reliability.