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Thermo Fisher Scientific (formerly FEI) Talos F200X

UsedThermo Fisher Scientific (formerly FEI)Scanning electron microscopesNetherlands
Procurable

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High Voltage
80 kV to 200 kV
Vacuum System Airlock Pumping
Oil- and vibration-free
Vacuum System Cold Trap
Standard
Vacuum System Long-duration Dewar
Optional - at least 4 days stand-time (between refills)
TEM Information Limit Resolution
0.12 nm
Availability
Procurable
Lead time
Confirmed with your quote
All 26 specifications
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Specifications 26

Brands
Thermo Fisher Scientific (formerly FEI)
New/Used
Used
High Voltage
80 kV to 200 kV
Vacuum System Airlock Pumping
Oil- and vibration-free
Vacuum System Cold Trap
Standard
Vacuum System Long-duration Dewar
Optional - at least 4 days stand-time (between refills)
TEM Information Limit Resolution
0.12 nm
STEM HAADF Resolution
0.16 nm
Electron Energy Loss Spectroscopy (EELS) Energy Resolution (X-FEG)
0.8 eV
Electron Energy Loss Spectroscopy (EELS) Energy Resolution (X-CFEG)
0.3 eV
STEM Resolution (S-FEG/X-FEG)
0.16 nm
STEM Resolution (X-CFEG with 100 pA)
0.14 nm
EELS Energy Resolution (S-FEG/X-FEG)
0.8 eV
EELS Energy Resolution (X-CFEG)
0.3 eV
Gun Brightness at 200 kV (X-FEG)
1.8×10⁹ A/cm²·s·sr
Gun Brightness at 200 kV (X-CFEG)
2.4×10⁹ A/cm²·s·sr
Software
Velox, Gatan DigitalMicrograph, S/TEM Tomography 4.x Data Acquisition Software, Inspect3D Xpress for Tomography reconstruction, Axon software integrates with the Talos to dramatically improve sample stability during in situ experiments. Axon tracks sample location and minimizes sample motion during sample heating, cooling, or when gasses or liquids are introduced in sample chamber.
Operating System
Windows® 10
Remote Control Capability
Yes
Gun Brightness at 200 kV (S-FEG)
4×10⁸ A/cm²·s·sr
Sample Holders
Single-tilt holder, Multi-specimen holder (up to 3 grid-mounted specimens), High-visibility and Low-background Double-tilt holder, Gatan 70 degree Field of View Cryo-transfer holder and Cryo test, Double-tilt LN₂ cooled holder, Low-background and High-visibility Tomography holder, Protochips Aduro double tilt heating holder, Protochips Poseidon Electrochemistry Liquid holder, Protochips Atmosphere system (Gas holder)
Attachments
Piezo-Enhanced CompuStage (x,y), Super-X EDS system (Resolution: 136 eV): point mode, line scan, mapping, hyper mapping, Segmented STEM detectors: STEM bright field and dark field imaging, including bright field detector, high angle annular dark field detector (HAADF), and two annular dark field detectors to cover different angle range, iDPC (Integrated Differential Phase Contrast) imaging, Gatan Energy Filtered TEM (EFTEM): Quantum SE/963, equipped with a 2k x 2k CCD detector, Ceta 16M Camera with speed upgrade: 4k x 4k CMOS sensor, to record and store >30 full (4k x 4k) frames per second (fps) and >250 fps for 512 x 512 pixels; high dynamic range mode allowing alternating short and long exposures; Smart user interface to adapt the dynamic range for different tasks, Gatan 655 Dry Pumping Station for Cryo holders, Vitrobot sample preparation for Cryo-electron microscopy, An integrated RGA (residual gas analyzer) is now attached to the Protochips Atmosphere system. The RGA enables quantitative control and examination of nanoscale reactions within the gas cell holder, and allows for improved control over gas chemistries introduced to the sample environment.
EDS Detector Size (Bruker X-flash)
30, 100 or dual 100 mm²
EDS Detector Retractable
Yes, motorized
Availability
Procurable
Lead time
Confirmed with your quote

Product description

Dual SEM/TEM system with sub-nm resolution, EDS, EBSD, and environmental modes for nanoscale imaging and analysis.

The FEI SEM/TEM is a versatile electron microscopy system designed for high-resolution imaging and analysis at the nanoscale. Combining the capabilities of both Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), this instrument enables detailed examination of material structures, making it indispensable in various scientific and industrial applications.

Key features include:

  • Dual-beam functionality: Integrates SEM and TEM for comprehensive imaging and analysis.
  • High-resolution imaging: Achieves sub-nanometre resolution for detailed structural analysis.
  • Versatile sample handling: Accommodates a wide range of sample types, including non-conductive and hydrated specimens.
  • Advanced analytical capabilities: Equipped with Energy-Dispersive X-ray Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) for elemental and crystallographic analysis.
  • Environmental modes: Features low vacuum and environmental SEM (ESEM) modes for imaging samples in their natural state.

This system is widely applied in fields such as materials science, nanotechnology, biotechnology, and semiconductor research. It is commonly utilized in university laboratories, biomedical research centres, and industrial R&D facilities. The FEI SEM/TEM has been a critical tool in scientific research and industrial applications since its introduction, and it continues to be relevant in current research and development endeavours.

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Frequently asked questions

How long does laboratory equipment typically last?

With a service contract, ten to fifteen years is normal for most benchtop instruments. Detectors and pumps are the parts that wear first.

Can I get service for older equipment?

Often, yes. Verified suppliers frequently work with service partners converting the instrument. If applicable, we can list servicing options alongside the offer.

Where can I buy parts?

Ask a scientist through the request button. Parts are often available even when the instrument itself is discontinued.

What is the typical lead time for refurbished equipment?

Two to six weeks, depending on refurbishment scope and whether calibration is included.

Does laboratory equipment ship internationally?

We ship to 38 countries. Crating and customs handling are quoted with the instrument.

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Last updated 3 November 2026