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Atomic resolution TEM with Cold FEG, ASCOR, COSMO aberration correction, and enhanced STEM e-ABF detector.
The JEOL ARM200F is an advanced atomic resolution transmission electron microscope (TEM) designed for high-precision imaging and analysis at the atomic scale. Equipped with JEOL's unique cold field emission gun (Cold FEG) and a spherical aberration corrector (ASCOR), this instrument delivers exceptional imaging capabilities across various accelerating voltages, including low voltages down to 30 kV.
Key features include:
The ARM200F is widely utilised in materials science, nanotechnology, and biotechnology research, facilitating detailed structural and compositional analyses at the atomic level. Its capabilities are particularly beneficial in bioprocessing, gene editing, and synthetic biology, where understanding material properties at the nanoscale is crucial.
Commonly found in university laboratories, biomedical research centres, and biopharmaceutical companies, the ARM200F supports cutting-edge research and development. First introduced in 2009, it remains a relevant and powerful tool in the scientific community.
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We're an independent team based in The Netherlands, working with research labs and procurement teams across Europe and worldwide.
With a service contract, ten to fifteen years is normal for most benchtop instruments. Detectors and pumps are the parts that wear first.
Often, yes. Verified suppliers frequently work with service partners converting the instrument. If applicable, we can list servicing options alongside the offer.
Ask a scientist through the request button. Parts are often available even when the instrument itself is discontinued.
Two to six weeks, depending on refurbishment scope and whether calibration is included.
We ship to 38 countries. Crating and customs handling are quoted with the instrument.
Tell us what you need and a scientist finds it for you, usually within the hour.
Last updated 20 October 2026
