Climet CI-754-03 Portable Airborne Particle Counter

This listing is for a Climet CI-754-03 Portable Airborne Particle Counter.The unit is in full working condition and is ready for immediate release.This unit is supplied with: Protective carry case, tubing, cables and more. Please see images.The Climet CI-754-03 Portable Airborne Particle Counter is an excellent choice for cleanroom environments, offering comprehensive features for particle counting and air quality assessment. Here’s a detailed overview of its capabilities and specifications:Key Features:Sample Flow Rate: 75 LPM, ensuring efficient sampling of airborne particles.Particle Measurement Channels: Measures particles in four sizes: 0.3 μm, 0.5 μm, 1 μm, and 5 μm, allowing for versatile monitoring.Standards Compliance:Fully compliant with ISO 21501-5 for accuracy and performance.Exceeds ISO 21501-4 standards with a count efficiency of 50% and accuracy of less than ±10%.Specifications:Count Efficiency:100% for laser alignment.Zero Count compliant with ISO standards.Internal Printing: Enables immediate data recording and reporting.Cleaning Compatibility: Can withstand common sterilization processes, including VHP (Vaporized Hydrogen Peroxide).Programs and Memory:User Programs: Supports up to 30 user-defined programs, helping tailor the device to specific operational needs.Sample Memory: Stores data for 3000 samples, including critical information such as date, time, particle counts, and volumes.Data Transfer: Easy transfer to a PC via RS232, Ethernet, or USB jump drive.Security Features:Authentication: Four security levels with user authentication, accommodating up to 20 user IDs plus a supervisor level with password protection.Location Identification: Store up to 100 location IDs per program, each allowing for 16 characters.Cloning Capability: Supports cloning for seamless data transfer between units and PCs via USB flash drives, enhancing operational efficiency.Applications:Ideal for environments where air quality is critical, including pharmaceutical manufacturing, semiconductor fabrication, and any cleanroom requiring rigorous particle monitoring.